Comprehensive Analysis of Low-frequency Noise Variability Components in Bulk and FDSOI (SOTB) MOSFETs

K. Maekawa

doi:https://doi.org/10.7567/SSDM.2017.E-1-02

2:00 PM - 2:20 PM

[E-1-02] Comprehensive Analysis of Low-frequency Noise Variability Components in Bulk and FDSOI (SOTB) MOSFETs

^○K. Maekawa¹, H. Makiyama¹, Y. Yamamoto¹, T. Hasegawa¹, S. Okanishi¹, K. Sonoda¹, H. Shinkawata¹, T. Yamashita¹, S. Kamohara¹, Y. Yamaguchi¹ (1.Renesas Electronics Corp. (Japan))

https://doi.org/10.7567/SSDM.2017.E-1-02

2017 International Conference on Solid State Devices and Materials

[E-1-02] Comprehensive Analysis of Low-frequency Noise Variability Components in Bulk and FDSOI (SOTB) MOSFETs