The Japan Society of Applied Physics

10:00 〜 10:20

[G-5-02] Impact of Drain Current to Appearance Probability and Amplitude of Random Telegraph Noise in Low Noise CMOS Image Sensors

S. Ichino1, T. Mawaki1, A. Teramoto1, R. Kuroda1, H. Park1, T. Maeda1, S. Wakashima1, T. Goto1, T. Suwa1, S. Sugawa1 (1.Tohoku Univ. (Japan))

https://doi.org/10.7567/SSDM.2017.G-5-02