10:00 〜 10:20

[G-5-02] Impact of Drain Current to Appearance Probability and Amplitude of Random Telegraph Noise in Low Noise CMOS Image Sensors

^○S. Ichino¹, T. Mawaki¹, A. Teramoto¹, R. Kuroda¹, H. Park¹, T. Maeda¹, S. Wakashima¹, T. Goto¹, T. Suwa¹, S. Sugawa¹ (1.Tohoku Univ. (Japan))

https://doi.org/10.7567/SSDM.2017.G-5-02