14:10 〜 14:30

[G-7-02] High Volume Testing and Calibration Technique of CMOS Analog Circuits for System-on-Chips and Microprocessors

^○T. Oshita¹, J. Douglas¹, A. Krishnamoorthy¹ (1.Intel Corp. (USA))

https://doi.org/10.7567/SSDM.2017.G-7-02