10:45 AM - 11:00 AM
[N-3-05] Drain-induced barrier lowering in normally-off AlGaN-GaN MOSFETs with single- or double-recess overlapped gate
○T. Sato1, K. Uryu1, J. Okayasu1, M. Kimishima1, T. Suzuki2
(1.Advantest Labs. Ltd. (Japan), 2.JAIST (Japan))
https://doi.org/10.7567/SSDM.2017.N-3-05