Characterization of Ga<sub>2</sub>O<sub>3</sub> MOSFETs for Low to Medium Power Applications

G. H. Jessen

doi:https://doi.org/10.7567/SSDM.2017.O-3-01

9:30 AM - 10:00 AM

[O-3-01 (Invited)] Characterization of Ga₂O₃ MOSFETs for Low to Medium Power Applications

^○G. H. Jessen¹, K. Chabak¹, A. Green^2,1, N. Moser^3,1, J. McCandless^2,1, K. Leedy¹, A. Crespo¹, S. Tetlak¹ (1.Air Force Research Lab. (USA), 2.KBRwyle (USA), 3.George Mason Univ. (USA))

https://doi.org/10.7567/SSDM.2017.O-3-01

2017 International Conference on Solid State Devices and Materials

[O-3-01 (Invited)] Characterization of Ga2O3 MOSFETs for Low to Medium Power Applications

[O-3-01 (Invited)] Characterization of Ga₂O₃ MOSFETs for Low to Medium Power Applications