[PS-12-13] Reliability Characteristics for Magnetic Tunnel Junctions with MgO Tunnel Barrier in Low Voltage B. So1,○C. Choi1, H. Sukegawa2, S. Mitani2, Y. Song1 (1.Hanyang Univ. (Korea), 2.NIMS (Japan)) https://doi.org/10.7567/SSDM.2017.PS-12-13