[PS-13-22 (Late News)] Detection of electron trapping/detrapping in MoS₂ FET by high time-resolved I-V measurement

^○K. Taniguchi¹, K. Nagashio^1,2 (1.Univ. of Tokyo (Japan), 2.PRESTO-JST (Japan))

https://doi.org/10.7567/SSDM.2017.PS-13-22