12:01 〜 12:03 [PS-6-14] In-Situ Mapping of Degradation of AlGaN/GaN MIS-HEMTs Using Video-Mode Scanning Internal Photoemission Microscopy ○K. Shiojima1, S. Murase1, Y. Watamura2, T. Suemitsu2 (1.Univ. of Fukui (Japan), 2.Tohoku Univ. (Japan))
