The Japan Society of Applied Physics

15:00 〜 15:15

[B-1-04] Reliable and Low Forming Voltage RRAM Enabled by Contact Shrinking and Pre-Soldering Baking

C.H. Wang1, F.M. Lee1, Y.Y. Lin1, P.H. Tseng1, K.C. Hsu1, D.Y. Lee1, M.H. Lee1, H.L. Lung1, K.Y. Hsieh1, K.C. Wang1, C.Y. Lu1 (1.Macronix International Co., Ltd. (Taiwan))

https://doi.org/10.7567/SSDM.2018.B-1-04