The Japan Society of Applied Physics

14:45 〜 15:00

[C-1-03] Challenges and Opportunities for Vertical Nanowire FETs: Device Design and Fabrication

A. Veloso1, P. Matagne1, T. Huynh-Bao1, G. Eneman1, R. Loo1, K. Wostyn1, S. Brus1, J. Boemmels1, D. Mocuta1, J. Ryckaert1 (1.Imec (Belgium))

https://doi.org/10.7567/SSDM.2018.C-1-03