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[C-2-03] Temperature Effect on DIBL Variability in Bulk and SOTB MOSFETs

^○S. Gao¹, T. Mizutani¹, K. Takeuchi¹, M. Kobayashi¹, T. Hiramoto¹ (1.Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2018.C-2-03