11:30 AM - 11:45 AM

[C-4-04] Impact of channel thickness fluctuation on performance of bilayer tunneling field effect transistors

^○K. Kato¹, H. Matsui¹, H. Tabata¹, M. Takenaka¹, S. Takagi¹ (1.Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2018.C-4-04