9:00 AM - 9:15 AM

[C-7-01] Deep Experimental Analysis of Negative Capacitance in HfZrO_x-Based Field-Effect Transistors

^○J. Li¹, J. Zhou^1,2, G. Han¹, Y. Liu¹, Y. Hao¹ (1.Xidian University (China), 2.University of California at Berkeley (USA))

https://doi.org/10.7567/SSDM.2018.C-7-01