Time Domain Reflectometry of Organic Thin Film Transistor

M. Sakai

doi:https://doi.org/10.7567/SSDM.2018.K-5-02

2018 International Conference on Solid State Devices and Materials

2018年9月9日〜 2018年9月13日
University of Tokyo

13:45 〜 14:00

[K-5-02] Time Domain Reflectometry of Organic Thin Film Transistor

^○M. Sakai¹, T. Honda¹, Y. Okada¹, H. Yamauchi¹, Y. Sadamitsu², Y. Hashimoto², N. Onodera², K. Kudo¹ (1.Chiba Univ. (Japan), 2.Nippon Kayaku Co. Ltd. (Japan))

https://doi.org/10.7567/SSDM.2018.K-5-02

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