11:00 AM - 1:30 PM

[PS-10-14] Wafer-Level-Probing Electrical Properties of Planar Junctionless Poly-Si Thin-Film Transistors Using a Novel C-V Charcacterization Scheme

^○C.M. Chuang¹, K.P. Peng¹, Y.T. Chang¹, H.C. Lin¹, P.W. Li¹ (1.National Chiao Tung Univ. (Taiwan))

https://doi.org/10.7567/SSDM.2018.PS-10-14