Experimental study of bias stress degradation of organic thin film transistors

11:30 〜 11:45

[A-6-04] Experimental study of bias stress degradation of organic thin film transistors

^○K. Oshima¹, M. Saito¹, M. Shintani², K. Kuribara³, Y. Ogasahara³, T. Sato¹ (1.Kyoto Univ. (Japan), 2.NAIST (Japan), 3.AIST (Japan))