09:00 〜 09:30

[K-3-01 (Invited)] State-of-the Art IGBT and Development towards Higher Operation Temperature and Power Ratings

^○J. Vobecky¹, C. Corvasce¹, E. Buitrago¹, M. Andenna¹, B. Boksteen¹, G. Paques¹ (1.ABB Semiconductors (Switzerland))

https://doi.org/10.7567/SSDM.2019.K-3-01