4:15 PM - 4:30 PM

[M-4-04] Investigation of Gate-Length Dependence of Memory Window for 2D Ferroelectric-FET NVMs Considering the Impact of Spacers

^○W.-X. You¹, P. Su¹ (1.National Chiao Tung Univ. (Taiwan))

https://doi.org/10.7567/SSDM.2019.M-4-04