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[N-1-04] Statistical Analysis of Temperature Dependence of Worst Case SRAM Data Retention Voltage Using Extreme Value Theory

^○T. Mizutani¹, K. Takeuchi¹, T. Saraya¹, M. Kobayashi¹, T. Hiramoto¹ (1.Univ. of Tokyo (Japan))

https://doi.org/10.7567/SSDM.2019.N-1-04