17:00 〜 17:15
[N-2-06] Experimental demonstration of n- and p-channel GaN MOSFETs operation for power IC
○N.H. Trung1, N. Taoka2, H. Yamada1, T. Takahashi1, T. Yamada1, M. Shimizu1
(1.AIST-NU GaN-OIL (Japan), 2.Nagoya Univ. (Japan))
https://doi.org/10.7567/SSDM.2019.N-2-06