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[PS-10-10] Characterization of Asymmetry in Ni-Seed-Induced Laterally Crystallized (SILC) TFTs by Bew Gate-Floating-Drain-Current (GFDC) Method

^○C.C. Chung¹, L.C. Liu¹, T.S. Chao¹ (1.National Chiao Tung Univ. (Taiwan))

https://doi.org/10.7567/SSDM.2019.PS-10-10