The Japan Society of Applied Physics

1:00 PM - 3:00 PM

[PS-4-28 (Late News)] Demonstration of n-MOSFET operation and internal charge analysis of SiO2/Al2O3 gate dielectric on (111) oriented 3C-SiC

R. Oka1, K. Yamamoto1, D. Wang1, H. Nakashima1, S. Hishiki2, K. Kawamura2 (1.Kyushu Univ. (Japan), 2.Air Water Inc. (Japan))

https://doi.org/10.7567/SSDM.2019.PS-4-28