Integrated Simulation Methodology for EM-induced Circuit Degradation

Y. Xiao

2019 International Conference on Solid State Devices and Materials

2019年9月2日〜 2019年9月5日
Nagoya University

10:47 〜 10:49

[PS-3-02] Integrated Simulation Methodology for EM-induced Circuit Degradation

^○Y. Xiao¹, H. Jiang¹, Z. Ahmed¹, Z. Ma¹, C. Prawoto¹, C.J. Estrada¹, L. Zhang², M. Chan¹ (1.The Hong Kong Univ. of Sci. and Tech. (Hong Kong), 2.Shenzhen Univ. (China))

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