2019 International Conference on Solid State Devices and Materials
Sep 2, 2019 - Sep 5, 2019 Nagoya University
10:47 AM - 10:49 AM
[PS-3-02] Integrated Simulation Methodology for EM-induced Circuit Degradation
○Y. Xiao1, H. Jiang1, Z. Ahmed1, Z. Ma1, C. Prawoto1, C.J. Estrada1, L. Zhang2, M. Chan1 (1.The Hong Kong Univ. of Sci. and Tech. (Hong Kong), 2.Shenzhen Univ. (China))
