11:00 〜 11:30

[J-4-01 (Invited)] An Assessment on Dynamic Physical Changes in Dielectric Thin Films:
A View Toward the Mechanism Behind The Resistive Switching

〇Nobuhiko P. Kobayashi¹, John F. Sevic¹, and Foroozan S. Koushan¹ (1. University of California, Santa Cruz(United States of America))

https://doi.org/10.7567/SSDM.2020.J-4-01