The 66th JSAP Spring Meeting, 2019

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Symposium (Oral)

Symposium » Nanoscale 2D/3D analyses for new device and materials development II

[10p-W933-1~9] Nanoscale 2D/3D analyses for new device and materials development II

Sun. Mar 10, 2019 1:30 PM - 5:45 PM W933 (W933)

Yuji Matsumoto(Tohoku Univ.), Takashi Furukawa(Hitachi High-Technologies Corporation)

2:00 PM - 2:15 PM

[10p-W933-2] Investigation of carrier dynamics in organic thin-film transistors using frequency-modulated scanning capacitance force microscopy (FM-SCFM)

〇Tsutau Yokocho1, Koichi Innami1, Kei Kobayashi1, Hirofumi Yamada1 (1.Kyoto Univ.)

Keywords:scanning capacitance force microscopy, organic thin-film transistor