[P-3-26] Low Power CMOS Stress Degradation Study by Device Current Optimization on SRAM Cell Application

Y. C. Yang¹、C. C. Ko¹、C. C. Wang¹、S. Y. Wu¹、K. C. Su¹ (1.UMC, Taiwan)

https://doi.org/10.7567/SSDM.2008.P-3-26