Thickness Effect on Read Window in a Two-Bit Nitrided-based Trapping Storage Cell

G. D. Lee; C. H. Cheng; S. H. Ku; C. H. Liu; S. H. Kuo; C. H. Lee; S. W. Huang; N. K. Zous; M. S. Chen; W. P. Lu; K. C. Chen; C. Y. Lu

doi:https://doi.org/10.7567/SSDM.2009.G-3-2

2009 International Conference on Solid State Devices and Materials

2009年10月6日〜 2009年10月9日
Sendai Kokusai Hotel, Miyagi, Japan

[G-3-2] Thickness Effect on Read Window in a Two-Bit Nitrided-based Trapping Storage Cell

G. D. Lee¹、C. H. Cheng¹、S. H. Ku¹、C. H. Liu¹、S. H. Kuo¹、C. H. Lee¹、S. W. Huang¹、N. K. Zous¹、M. S. Chen¹、W. P. Lu¹、K. C. Chen¹、C. Y. Lu¹ (1.Macronix Int'l Co., Ltd.)

https://doi.org/10.7567/SSDM.2009.G-3-2

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