[P-3-11] New Observations of FN Stress Induced Performance Degradation of RF MOSFETs

B. Xiao¹, L. Zhang¹, R. Huang¹, D. Wu¹, F. Song¹, Y. Y. Wang¹ (1.Peking Univ.)

https://doi.org/10.7567/SSDM.2009.P-3-11