[3K07-10] Radiation Redistant Technology

[3K09] Optically reconfigurable gate array VLSI with a triple modular redundancy structure

*Toru Yoshinaga¹, Minoru Watanabe¹ (1. Shizuoka Univ.)

Keywords:Optically reconfigurable gate array, Soft error tolerance, TMR, FPGA

For Fukushima Daiichi nuclear power plant's decommissioning operations, radiation-hardened devices are being required. Therefore, we have been developing radiation-hardened optically reconfigurable gate arrays with a high-total-ionizing-dose tolerance. Moreover, we have developed a new radiation-hardened optically reconfigurable gate array which can support a triple modular redundancy implementation. This paper shows the architecture and the experimental results.