[2F01-04] Nuclear Data Measurement 2

[2F03] Measurement plan of muon-nuclear capture reaction for the estimation of soft-error rate in semiconductor devices induced by cosmic-ray muons

(1)Overview

*Shoichiro Kawase¹, Hiroya Fukuda¹, Yukinobu Watanabe¹, Megumi Niikura², Masanori Hashimoto³ (1. Kyushu Univ., 2. UTokyo, 3. Kyoto Univ.)

Keywords:muon nuclear capture reaction, soft error

Soft error is a temporary malfunction of semiconductor devices caused by radiation that incidents on them. In recent years, semiconductor devices have become increasingly miniaturized, raising the risk of cosmic-ray muon-induced soft errors. In particular, charged particles emitted due to muon nuclear capture reactions are known to contribute to soft errors. However, there is a lack of experimental data on the energy spectrum of charged particles emitted from muon nuclear capture reactions on silicon atoms. We, therefore, plan to measure the charged-particle energy spectra emitted after muon capture reactions on silicon atoms. In this talk, the outline of the research plan will be presented.