[2F01-04] Nuclear Data Measurement 2

[2F04] Measurement plan of muon-nuclear capture reaction for the estimation of soft-error rate in semiconductor devices induced by cosmic-ray muons

(2)Development of charged-particle measurement system

*Hiroya Fukuda¹, Shoichiro Kawase¹, Yukinobu Watanabe¹, Masaya Oishi¹, Teppei Kawata¹, Shintaro Go¹, Hiroki Nishibata¹, Megumi Niikura², Daisuke Suzuki³, Seiya Manabe⁴ (1. Kyushu Univ., 2. UTokyo, 3. RIKEN, 4. AIST)

Keywords:muon nuclear capture reaction, soft error

We are developing a charged-particle measurement system to acquire energy spectra of charged particles emitted after muon nuclear capture reaction. For particle identification, the pulse shape analysis method with nTD-Si detectors for low-energy charged-particles and ΔE-E method with thin Si detectors and CsI scintillators for high-energy charged-particles. In this talk, the results of test experiments at Center for Accelerator and Beam Applied Science of Kyushu University will be presented.