4:50 PM - 5:05 PM
[2I16] Development of a two-dimensional distribution measurement system of mobility in TlBr semiconductor detectors
Keywords:Semiconductor detector, TlBr, Mobility
We have evaluated the crystal quality of TlBr using neutron Bragg-dip imaging and electron backscatter diffraction. To reveal a relationship between crystal quality and carrier transport properties, we developed a two-dimensional distribution measurement system of mobility in