[2I13-17] New Methods and Technologies

[2I16] Development of a two-dimensional distribution measurement system of mobility in TlBr semiconductor detectors

*Kenichi Watanabe¹, Yusuke Sugai¹, Sota Hasegawa¹, Mitsuhiro Nogami², Keitaro Hitomi² (1. Kyushu Univ., 2. Tohoku Univ.)

Keywords:Semiconductor detector, TlBr, Mobility

We have evaluated the crystal quality of TlBr using neutron Bragg-dip imaging and electron backscatter diffraction. To reveal a relationship between crystal quality and carrier transport properties, we developed a two-dimensional distribution measurement system of mobility in