[3D01-07] Imaging and Experiment Physics

[3D04] Verification of recoil electron-tracking Compton imaging with a silicon on insulator pixel sensor

*Mizuki Uenomachi¹, Qinghong ZHU², Kenji Shimazoe², Hiroyuki Takahashi², Koyo Magata³, Rikuto Kawashima³, Ayaki Takeda³, Takeshi Tsuru¹ (1. Kyoto Univ., 2. UTokyo, 3. The Univ. of Miyazaki)

Keywords:Compton imaging, Recoil electron tracking, Silicon on insulator pixel sensor

Compton imaging is one of gamma-ray imaging methods based on Compton scattering kinematics. The position of a radioactive source can be estimated only on a conical surface because energies of Compton-scattered and fully absorbed photon provide only angle information of incoming gamma-ray. On the other hand, the recoil electron trajectory in a scatterer can specify the direction of the gamma-ray, and result in the improvement of the signal-to-noise ratio of the reconstructed image. In this study, we will report the verification of electron-tracking Compton imaging with a silicon on insulator fine-pitch pixel sensor.