[CMP11A] QD Devices and Crystal Growth Technology

[CMP11A-06] Near-field Analysis of VCSELs after HTOL test

*Hao-Tien Cheng¹, Taixian Zhang², Yun-Cheng Yang², Te-Hua Liu², Chao-Hsin Wu^1,2 (1. Graduate Inst. of Electronics Engineering, National Taiwan Univ. (Taiwan), 2. Graduate Inst. of Photonics and Optoelectronics, National Taiwan Univ. (Taiwan))

[Presentation Style] Onsite

Investigation on the failure mechanisms of 850 nm vertical-cavity surface-emitting laser (VCSEL) chips in the high-temperature operating life (HTOL) stress tests are presented. Selected failed chips are put into further analysis to study their early failure mechanisms.