CLEO-PR2022/ISOM'22/ODF'22

Presentation information

Oral Session

CLEO-PR2022 » QD Devices and Crystal Growth Technology

[CMP11A] QD Devices and Crystal Growth Technology

Mon. Aug 1, 2022 1:30 PM - 3:00 PM Room 104&105 (1F)

Session Chair: Tomohiro Amemiya (Tokyo Tech)

2:45 PM - 3:00 PM

[CMP11A-06] Near-field Analysis of VCSELs after HTOL test

*Hao-Tien Cheng1, Taixian Zhang2, Yun-Cheng Yang2, Te-Hua Liu2, Chao-Hsin Wu1,2 (1. Graduate Inst. of Electronics Engineering, National Taiwan Univ. (Taiwan), 2. Graduate Inst. of Photonics and Optoelectronics, National Taiwan Univ. (Taiwan))

[Presentation Style] Onsite

Investigation on the failure mechanisms of 850 nm vertical-cavity surface-emitting laser (VCSEL) chips in the high-temperature operating life (HTOL) stress tests are presented. Selected failed chips are put into further analysis to study their early failure mechanisms.