9:05 AM - 9:50 AM
[K401-2am-01] Recent development of the atom-resolved electron microscopy
Keynote Lecture
[Lang.] Japanese
Keywords:STEM, Aberration corrector, In-situ Observation, Grain Boundary, Segregation
Symposium
Co-Innovation Program (CIP) » New Trends in Materials Informatics and Their Practical Applications
Thu. Mar 23, 2023 9:00 AM - 11:40 AM K401 (K401, Lecture Hall Bldg. [4F])
Chair, Symposium organizer: Nobuyuki Zettsu, Tadashi Taniguchi
9:05 AM - 9:50 AM
[Lang.] Japanese
Keywords:STEM, Aberration corrector, In-situ Observation, Grain Boundary, Segregation