D-1 Nano-scale measurements and calibrations

[D-1-7] Improving the spatial resolution of passive near-field microscope with a 10 nm-sharp tungsten probe apex

〇Hitomi Nakajima¹、Lin Kuan-Ting¹、Ryoko Sakuma¹、Fuminobu Kimura¹、Yusuke Kajihara¹ (1.The University of Tokyo)

キーワード：Measurement、Passive near-field microscopy、Electrochemical etching、Spatial resolution、Tungsten probe