ICPE2020

講演情報

Oral Sessions

F-1 Advanced surface processings

[F-1-2] Formation of Trench Pattern on Ge Surface by Enhanced Chemical Etching Using Chemically Modified Graphene Flakes

〇Ryo Mikurino1、Ayumi Ogasawara1、Tomoki Hirano1、Kentaro Kawai1、Kazuya Yamamura1、Kenta Arima1 (1.Osaka University)

キーワード:Surface treatment、graphene surface、trench formation、dissolved oxygen、