スケジュール 5 11:15 〜 11:30 [We-2A-02] The Effects of Coulomb Scattering Centers at SiO2/SiC interfaces on Electron Mobility in Inversion Layers *Tetsuo Hatakeyama1,2, Minoru Sometani2, Hirohisa Hirai2, Shinsuke Harada2 (1. Toyama Pref. Univ.(Japan), 2. AIST(Japan))