^○(D)Tomoki Koyama¹, Hiroyuki Mogi¹, Leonid Bolotov², Takeo Minari³, Osamu Takeuchi¹, Hidemi Shigekawa¹ (Institute of Applied Physics, Univ. of Tsukuba¹, AIST², NIMS³)

9:30 AM - 11:30 AM

[18a-P3-7] Surface Potential Mapping of Fullerene Ultrathin film on MoS₂ by FM-KFM

^○Akihiro Noda¹, Kei Kobayashi^1,2, Hirohumi Yamada¹ (Dept.of Electronic Sci. & Eng., Kyoto Univ.¹, The Hakubi Center, Kyoto Univ.²)

9:30 AM - 11:30 AM

[18a-P3-8] STM/STS of DNA on Graphene

^○Hiroyuki Tanaka¹ (Osaka Univ. ISIR¹)

Oral presentation

[19a-D2-1~15] 6.6 Probe microscopy

Thu. Sep 19, 2013 9:00 AM - 1:00 PM D2 (MK 1F-102)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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9:00 AM - 9:15 AM

[19a-D2-1] [JSAP Young Scientist Award Speech](15 min.) Simultaneous Scanning Force/Tunneling Microscopy Using a Quartz Cantilever with a Tungsten Tip

^○Ken-ichi Morita¹ (Osaka Univ.¹)

9:15 AM - 9:30 AM

△ [19a-D2-2] Nano-scale Elemental Analysis of Metallic Interface using SR-STM

^○(M2)Hiromutsu Miki^1,2, Akira Saito^1,2, Yudai Furudate^1,2, Yasumasa Takagi³, Yoshihito Tanaka², Yoshiki Kohmura², Megumi Akai-Kasaya¹, Tetsuya Ishikawa², Yuji Kuwahara^1,2, Masakazu Aono⁴ (Osaka Univ.¹, RIKEN/SPring-8², Inst. for Molecular Science³, NIMS⁴)

9:30 AM - 9:45 AM

△ [19a-D2-3] Investigation of local electrical properties of organic field-effect transistors by frequency-modulation scanning impedance microscopy

^○Tomoharu Kimura¹, Kei Kobayashi², Hirofumi Yamada¹ (Dept. of Electronic Sci. & Eng., Kyoto Univ.¹, Hakubi Center, Kyoto Univ.²)

9:45 AM - 10:00 AM

△ [19a-D2-4] Two prong force sensor based on quartz tuning fork for nc-AFM

^○(D)Hiroaki Ooe¹, Toyoko Arai¹ (Kanazawa Univ.¹)

10:00 AM - 10:15 AM

△ [19a-D2-5] Revealing resistive switching mechanism in NiO by combeining band excitation electrochemical strain microscopy and I-V mapping

^○(D)Issei Sugiyama¹, Naoya Shibata¹, Takahisa Yamamoto^1,2,3, Yuichi Ikuhara^1,2,4 (Tokyo Univ.¹, JFCC², Nagoya Univ.³, Tohoku Univ.⁴)

10:15 AM - 10:30 AM

△ [19a-D2-6] High-speed Atomic-resolution Imaging in Liquid by FM-AFM with Low-latency and Wideband PLL

^○Kazuki Miyata¹, Hitoshi Asakawa², Takeshi Fukuma^1,2,3 (Grad. school, Kanazawa Univ.¹, Bio-AFM FRC., Kanazawa Univ.², ACT-C/JST³)

10:30 AM - 10:45 AM

[19a-D2-7] Cantilevers with Photothermal Conversion Layer for High Efficiency Photothermal Excitation

^○Keita Suzuki¹, Hitoshi Asakawa², Takeshi Fukuma^1,2,3 (Kanazawa Univ.Grad.School¹, Kanazawa Univ .Bio-AFM FRC², ACT-C/JST³)

10:45 AM - 11:00 AM

[19a-D2-8] Metallic Cantilever Holder for Ultralow-drift AFM Measurements in Liquid

^○Hisanori Izumi¹, Naritaka Kobayashi¹, Hitoshi Asakawa², Takeshi Fukuma^1,2,3 (Kanazawa Univ.¹, Bio-AFM FRC, Kanazawa Univ.², ACT-C, JST³)

Break （11:00 AM - 11:15 AM）

11:15 AM - 11:30 AM

[19a-D2-9] Development of Time-resolved STM with Alternatively Switching Two Optical Paths

^○Masaya Shigeno¹, Toshihiko Kishizawa¹, Shoji Yoshida¹, Osamu Takeuchi¹, Hidemi Shigekawa¹ (University of Tsukuba¹)

11:30 AM - 11:45 AM

[19a-D2-10] Cathodoluminescence induced by surface plasmon in plasmonic cavity

^○KEISUKE OZAWA¹, NAOKI YAMAMOTO¹ (Tokyo Tech¹)

11:45 AM - 12:00 PM

[19a-D2-11] Development of scanning SQUID probe microscope with high permeability probe

^○Yuji Miyato¹, Yasunori Matsui¹, Kouhei Hisayama¹, Norimichi Watanabe¹, Hideo Itozaki¹ (Osaka Univ.¹)

12:00 PM - 12:15 PM

[19a-D2-12] Development of the preparation and evaluation method of tip for SP-STM

^○Shigeru Kaku¹, Masato Nishio¹, Masayuki Tsukui¹, Masahiro Hiraoka¹, Junji Yoshino¹ (Tokyo Tech.¹)

12:15 PM - 12:30 PM

[19a-D2-13] Evaluations of atomic structure and spin polarization at apex of tips used in spin-polarized scanning tunneling microscope

^○Shigekazu Nagai^1,2, Koichi Hata^1,2, Hirofumi Oka³, Sander Dirk³, Kirschner Jurgen³ (Graduate School of Eng., Mie Univ.¹, Mie CUTE², MPI³)

12:30 PM - 12:45 PM

[19a-D2-14] High Efficiency of Magnetic Modulation of a Magnetic Cantilever using Ferromagnetic Resonanc

^○Eiji Arima¹, Kiho Isoyama¹, Michika Kaneiwa¹, Yoshitaka Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

12:45 PM - 1:00 PM

[19a-D2-15] Observation of Graphene by Magnetic Force MicroscopyⅡ

^○Koutatsu Maruishi¹, Fujio Wakaya¹, Satoshi Abo¹, Mikio Takai¹ (CQSTEC.Osaka Univ.¹)

Oral presentation

[19p-D2-1~15] 6.6 Probe microscopy

Thu. Sep 19, 2013 2:30 PM - 6:30 PM D2 (MK 1F-102)

△：Young Scientist Oral Presentation Award Applied
▲：English Presentation
▼：Both Award Applied and English Presentation

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Lunch （1:00 PM - 2:30 PM）

2:30 PM - 2:45 PM

[19p-D2-1] Influence of charged samples on Scanning Ion Conductance Microscopy

^○Kimihiro Ishizaki¹, Tatsuo Ushiki², Masato Nakajima², Futoshi Iwata¹ (Shizuoka Univ.¹, Nigata Univ.²)

2:45 PM - 3:00 PM

[19p-D2-2] Electrochemical frequency modulation atomic force microscopy (EC-FM-AFM) observation of graphite electrode/aqueous solution interface

^○Toru Utsunomiya¹, Yasuyuki Yokota¹, Toshiaki Enoki², Ken-ichi Fukui¹ (Osaka Univ.¹, Tokyo Tech.²)

3:00 PM - 3:15 PM

[19p-D2-3] Structural Analysis on Ionic-liquid/Ionic-crystal Interfaces by using FM-AFM

^○Takashi Ichii¹, Masahiro Negami¹, Hiroyuki Sugimura¹ (Kyoto Univ.¹)

3:15 PM - 3:30 PM

[19p-D2-4] Investigation of hydration structures at the interface between alkali halide crystal surface and aqueous solution (2)

^○Fumiaki Ito¹, Kazuhiro Suzuki¹, Kei Kobayashi^1,2, Hirofumi Yamada¹ (Kyoto Univ.¹, Hakubi Center, Kyoto Univ.²)

3:30 PM - 3:45 PM

[19p-D2-5] Precise analysis of force maps acquired on surfactant assembly by FM-AFM (2)

^○(PC)Ken-ichi Umeda¹, Kazuhiro Suzuki¹, Kei Kobayashi², Hirofumi Yamada¹ (Dept. of Electronic Sci. & Eng., Kyoto Univ.¹, Hakubi Center, Kyoto Univ.²)

3:45 PM - 4:00 PM

[19p-D2-6] Ｍolecular-scale investigation of formation process of surfactant assembly by FM-AFM (2)

^○(PC)Kazuhiro Suzuki¹, Kei Kobayashi², Hirofumi Yamada¹ (Dept. of Electronic Sci. & Eng., Kyoto Univ.¹, Hakubi Center, Kyoto Univ.²)

4:00 PM - 4:15 PM

[19p-D2-7] Molecular-scale investigation of hydration structure of biomolecules by FM-AFM

^○(D)Zipeng Cui¹, Hiroaki Kominami¹, Kei Kobayashi^1,2, Hirofumi Yamada¹ (Dept.of Electronic Sci.&Eng.,Kyoto Univ.¹, Hakubi Center,Kyoto Univ.²)

Break （4:15 PM - 4:30 PM）

4:30 PM - 4:45 PM

[19p-D2-8] Atomic resolution imaging of the local contact potential difference with kelvin probe force microscopy without the dc bias voltage

^○(M1)Ryosuke Kanbayashi¹, Lili Kou¹, Yoshitaka Naitoh¹, YanJun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

4:45 PM - 5:00 PM

[19p-D2-9] Evaluation of alumina thin film by measuring contact potential deference

^○(M2)Yuta Ashida¹, Hirotaka Yokoyama¹, Yoshitaka Naitoh¹, Yan jun Ri¹, yasuhiro Sugawara¹ (Osaka Univ.¹)

5:00 PM - 5:15 PM

[19p-D2-10] Site specific surface potential measurement on Si(111)-(7×7) surface using noncontact scanning nonlinear dielectric microscopy

^○Kohei Yamasue¹, Masayuki Abe², Yoshiaki Sugimoto³, Yasuo Cho¹ (Tohoku Univ.¹, Nagoya Univ.², Osaka Univ.³)

5:15 PM - 5:30 PM

[19p-D2-11] Effect of tip polarity on Kelvin probe force microscopy

^○Yoshiaki Sugimoto¹, Ayhan Yurtsever², Masaki Fukumoto¹, Masayuki Abe³, Seizo Morita² (Osaka Univ.¹, Osaka Univ.², Nagoya Univ.³)

5:30 PM - 5:45 PM

[19p-D2-12] Cantilever holder for increasing Q factor of a cantilever

^○Kiho Isoyama¹, Eiji Arima¹, Yoshitake Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (Osaka Univ.¹)

5:45 PM - 6:00 PM

[19p-D2-13] Non-contact atomic force microscopy observation of etching of Si(111) surfaces by irradiation of atomic hydrogen

^○Tomoaki Miyagi¹, Akira Sasahara¹, Masahiko Tomitori¹, Ryohei Kokawa², Masahiro Ohta², Hirofumi Yamada³, Kei Kobayashi^3,4, Noriaki Oyabu^3,5 (JAIST.¹, Shimadzu Corp.², Dept. of Electronic Sci. &Eng.,Kyoto Univ.³, Hakubi Center, Kyoto Univ.⁴, JST.⁵)

6:00 PM - 6:15 PM

[19p-D2-14] Fabrication and Control of Pb-Atom Switch on Si(111)-(7x7) Surface

^○(PC)Eiichi Inami¹, Yoshiaki Sugimoto¹, Masayuki Abe², Seizo Morita³ (Osaka Univ.¹, Nagoya Univ.², ISIR, Osaka Univ.³)

6:15 PM - 6:30 PM

[19p-D2-15] Local Reactivity of Single-Walled Carbon Nanotubes with Different Tube Diameters, evaluated by 3D Force Field Spectroscopy

^○Makoto Ashino^1,2, Susumu Adachi², Naruo Sasaki³, Roland Wiesendanger¹ (Hamburg Univ.¹, Kanazawa Inst. Tech.², Seikei Univ.³)

Sessions

06. Thin Films and Surfaces » 6.6 Probe microscopy

[18a-P3-1~8] 6.6 Probe microscopy