The 74th JSAP Autumn Meeting,2013

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Oral presentation

06. Thin Films and Surfaces » 6.6 Probe microscopy

[19p-D2-1~15] 6.6 Probe microscopy

Thu. Sep 19, 2013 2:30 PM - 6:30 PM D2 (MK 1F-102)

3:30 PM - 3:45 PM

[19p-D2-5] Precise analysis of force maps acquired on surfactant assembly by FM-AFM (2)

○(PC)Ken-ichi Umeda1, Kazuhiro Suzuki1, Kei Kobayashi2, Hirofumi Yamada1 (Dept. of Electronic Sci. & Eng., Kyoto Univ.1, Hakubi Center, Kyoto Univ.2)

Keywords:表面科学,走査プローブ顕微鏡,周波数変調原子間力顕微鏡