The 74th JSAP Autumn Meeting,2013

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Oral presentation

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[16p-D3-1~13] 6.3 Oxide-based electronics

Mon. Sep 16, 2013 2:30 PM - 6:00 PM D3 (MK 2F-201)

5:00 PM - 5:15 PM

[16p-D3-10] Observation and Analysis of MoOx ReRAMs with Cu Top Electrodes

○Masaki Kudo1, Yuuki Ohno1, Kouichi Hamada1, Masashi Arita1, Yasuo Takahashi1 (Graduate School of IST, Hokkaido Univ.1)

Keywords:ReRAM,TEMその場観察,モリブデン酸化物