Evaluation of Interface State Density of Strained-Si MOS Interfaces by Conductance Method

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.3 Insulator technology

Tue. Sep 17, 2013 9:15 AM - 12:00 PM B5 (TC2 2F-201)

10:45 AM - 11:00 AM

^○Weili Cai¹, Mitsuru Takenaka¹, Shinichi Takagi¹ (The University of Tokyo¹)

Keywords:conductance method