The 74th JSAP Autumn Meeting,2013

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Oral presentation

13. Semiconductors A (Silicon) » 13.3 Insulator technology

[17a-B5-1~10] 13.3 Insulator technology

Tue. Sep 17, 2013 9:15 AM - 12:00 PM B5 (TC2 2F-201)

11:15 AM - 11:30 AM

[17a-B5-8] Estimation method of breakdown electric-field strength by using a molecular orbital calculation technique

○Shuichiro Wakao1,3, Hiroshi Seki2.3, Daisuke Kobayashi3, Tomoyuki Yamamoto1, Kenji Yasuoka2, Kazuyuki Hirose3 (Waseda Univ.1, Keio Univ.2, ISAS/JAXA3)

Keywords:絶縁破壊電界,第一原理計算