The 74th JSAP Autumn Meeting,2013

Presentation information

Oral presentation

15. Crystal Engineering » 15.6 IV-group-based compounds

[18a-B3-1~9] 15.6 IV-group-based compounds

Wed. Sep 18, 2013 9:00 AM - 11:30 AM B3 (TC2 1F-105)

10:00 AM - 10:15 AM

[18a-B3-5] Raman investigation for subsurface damage induced by scratching test using diamond and SiC scratchers

Takeshi Mitani1,2, Masaru Tomobe2, Shin-ichi Nakashima2, Tomohisa Kato1,2, Hajime Okumura1,2 (FUPET1, AIST2)

Keywords:raman,SiC