[18a-D3-1~11] 6.3 Oxide-based electronics

[18a-D3-10] Elucidating direct influence of atmospheric gases on physical property of filament using nano-scale planar ReRAM

^○Yusuke Sawai¹, Sang-Gyu Koh¹, Satoru Kishida^1,2, Kentaro Kinoshita^1,2 (Tottori Univ.¹, Tottori Univ. Electronic Display Research Center²)

Keywords:ReRAM,AFM電界酸化,プレーナー型