[19a-C8-1~12] 13.6 Silicon devices / Integration technology

▲ [19a-C8-8] Recovery Behaviors of |Vth| Shift of pFETs by High-Voltage OFF-State and ON-State Stress for Post-Fabrication SRAM Cell Stability Self-Improvement

^○Nurul Ezaila Alias¹, Anil Kumar¹, Takuya Saraya¹, Shinji Miyano², Toshiro Hiramoto¹ (IIS, Univ. of Tokyo¹, STARC²)

Keywords:OFF-state stress, ON-state stress,Variability,SRAM