The 74th JSAP Autumn Meeting,2013

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13. Semiconductors A (Silicon) » 13.6 Silicon devices / Integration technology

[20a-C8-1~12] 13.6 Silicon devices / Integration technology

Fri. Sep 20, 2013 9:00 AM - 12:15 PM C8 (TC3 2F-201)

11:45 AM - 12:00 PM

[20a-C8-11] Mechanism of Recovery from Negative Bias Temperature Instability

○Yoshiki Yonamoto1 (Hitachi, Ltd., Yokohama Laboratory1)

Keywords:NBTI,Trap