The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Poster presentation)

06. Thin Films and Surfaces » 6.3 Oxide-based electronics

[27a-PB2-1~24] 6.3 Oxide-based electronics

Wed. Mar 27, 2013 9:30 AM - 11:30 AM PB2 (2nd gymnasium)

[27a-PB2-20] Current - voltage characteristics of ReRAM involving sulfuric anodic porous alumina thin film with additional electrochemical treatment

Yusuke Tanimoto1, Saeko Furuya1, Shintaro Otsuka2, Tomohiro Shimizu2, Syouso Shingubara2, Tadataka Watanabe1, Yoshiki Takano1, Kouichi Takase1 (Nihon Univ.1, Kansai Univ.2)

Keywords:ReRAM、ポーラスアルミナ